Ionizing Radiation Effects in MOS Oxides.pdf

Ionizing Radiation Effects in MOS Oxides PDF

Timothy-R Oldham

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation. These same defects are also critical in many other areas of oxide reliability research. As a result of this work, the understanding of the basic physical mechanisms has evolved. This book summarizes the new work and integrates it with older work to form a coherent, unified picture. It is aimed primarily at specialists working on radiation effects and oxide reliability.

Abstract—Total ionizing dose radiation effects on the electrical properties of metal-oxide-semiconductor devices and integrated circuits are complex in nature  ...

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9789810233266 ISBN
Ionizing Radiation Effects in MOS Oxides.pdf

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Sofya Voigtuh

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 55, NO. 4 ... Radiation Effects in MOS Oxides James R. Schwank, Fellow, IEEE, Marty R. Shaneyfelt, Fellow, ionizing dose. Over the last thirty years, the effects of total ion-izing dose on radiation-induced charge buildup in oxides have been investigated in detail. In addition to total ionizing dose ef- fects, the energetic particles of space can also induce degrada-tion by other mechanisms. For example

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Mattio Müllers

Ionizing Radiation Effects In Mos Oxides: Oldham, … Ionizing Radiation Effects In Mos Oxides: Oldham, Timothy R: 9789810233266: Books - Amazon.ca

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Noels Schulzen

Telecharger Ionizing Radiation Effects in MOS Oxides PDF ... Le livre Ionizing Radiation Effects in MOS Oxides a été écrit le 02/03/2000 par Timothy-R Oldham. Vous pouvez lire le livre Ionizing Radiation Effects in MOS Oxides en format PDF, ePUB, MOBI sur notre site Web melcouettes.fr. Vous trouverez également sur ce site les autres livres de l'auteur Timothy-R Oldham.

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Jason Leghmann

The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation. These same defects are A study of radiation effects in MOS capacitors - …

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Jessica Kolhmann

SCHWANK et al.: RADIATION EFFECTS IN MOS OXIDES 1837 E. Device Properties For a gate oxide transistor, parasitic eld oxide transistor, or back-channel transistor of an SOI device (discussed below), the total threshold-voltage shift is the sum of the threshold-voltage shifts due to oxide-trap and interface-trap charge, i.e., (2) and can be determined from (3) is the charge distribution of